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1

Limited reaction processing: Growth of Si1−xGex/Si for heterojunction bipolar transistor applications

J.L. Hoyt, C.A. King, D.B. Noble, C.M. Gronet, J.F. Gibbons, M.P. Scott, S.S. Laderman, S.J. Rosner, K. Nauka, J. Turner, T.I. Kamins

Journal:

Thin Solid Films

Year:

1990

Language:

english

File:

PDF, 736 KB

english, 1990

2

Method for screening of solid dispersion formulations of low-solubility compounds—Miniaturization and automation of solvent casting and dissolution testing

Anant Shanbhag, Shelley Rabel, Ewa Nauka, Gemma Casadevall, Padmaja Shivanand, Gary Eichenbaum, Paul Mansky

Journal:

International Journal of Pharmaceutics

Year:

2008

Language:

english

File:

PDF, 553 KB

english, 2008

3

Sequence-Specific Label-Free DNA Sensors Based on Silicon Nanowires

Li, Z., Chen, Y., Li, X., Kamins, T. I., Nauka, K., Williams, R. S.

Journal:

Year:

2004

Language:

english

File:

PDF, 141 KB

english, 2004

4

Isolation, Structure Elucidation, and Synthesis of Irlbacholine, 1,22-Bis[[[2-(trimethylammonium)ethoxy]phosphinyl]oxy]docosane: A Novel Antifungal Plant Metabolite from Irlbachia alata and Anthocleista djalonensis

Bierer, Donald E., Gerber, R. Eric, Jolad, Shivanand D., Ubillas, Rosa P., Randle, Joaquin, Nauka, Ewa, Latour, John, Dener, Jeffrey M., Fort, Diana M.

Journal:

Journal of Organic Chemistry

Year:

1995

Language:

english

File:

PDF, 665 KB

english, 1995

5

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - A novel approach to monitoring of plasma processing equipment and plasma damage without test structures

Hoff, A., Nauka, K., Esry, T., Persson, E., Lagowski, J., Jastrzebski, L., Edelman, P.

Year:

1997

Language:

english

File:

PDF, 554 KB

english, 1997

6

Nature and Generation Mechanism of Butterfly-Type Intrinsic Gettering Centers in Oxygen-Free Silicon Crystals

Ueda, O., Nauka, K., Lagowski, J., Gatos, H.C.

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 543 KB

1986

7

Effect of Microenvironmental pH Modulation on the Dissolution Rate and Oral Absorption of the Salt of a Weak Acid – Case Study of GDC-0810

Hou, Hao Helen, Jia, Wei, Liu, Lichuan, Cheeti, Sravanthi, Li, Jane, Nauka, Ewa, Nagapudi, Karthik

Journal:

Pharmaceutical Research

Year:

2018

Language:

english

File:

PDF, 1.61 MB

english, 2018

8

Rapid oxidation of InP nanoparticles in air

J. Jasinski, V.J. Leppert, Si-Ty Lam, G.A. Gibson, K. Nauka, C.C. Yang, Zhang-Lin Zhou

Journal:

Solid State Communications

Year:

2007

Language:

english

File:

PDF, 569 KB

english, 2007

9

Contactless measurement of the Si-buried oxide interfacial charges in SOI wafers with surface photovoltage technique

Journal:

Microelectronic Engineering

Year:

1997

Language:

english

File:

PDF, 532 KB

english, 1997

10

Deep state defects in strained and relaxed epitaxial Si1−xGex on Si introduced by 3d transition metal and 5d noble metal impurities

K Nauka, T.I Kamins

Journal:

Physica B: Condensed Matter

Year:

1999

Language:

english

File:

PDF, 159 KB

english, 1999

11

Minority-carrier diffusion length in Zn3P2

K. Nauka, J. Misiewicz

Journal:

physica status solidi (a)

Year:

1981

Language:

english

File:

PDF, 132 KB

english, 1981

12

Photoluminescence and photoluminescence excitation spectroscopy of CdSe/ZnS core-shell free standing nanocrystals in the ultraviolet spectral range

A. Podhorodecki, J. Misiewicz, K. Nauka

Journal:

physica status solidi (c)

Year:

2006

Language:

english

File:

PDF, 562 KB

english, 2006

13

Effect of self-assembled Ge nanostructures on Si surface electronic properties

T.I. Kamins, K. Nauka, R.S. Williams

Journal:

Applied Physics A: Materials Science & Processing

Year:

2001

Language:

english

File:

PDF, 187 KB

english, 2001

14

Defect characterization of n-type Si1−xGexafter 1.0 kev helium-ion etching

S. A. Goodman, F. D. Auret, K. Nauka, J. B. Malherbe

Journal:

Journal of Electronic Materials

Year:

1997

Language:

english

File:

PDF, 686 KB

english, 1997

15

Leakage current in GaInAs/InP photodiodes grown by OMVPE

Kent W. Carey, Shih-Yuan Wang, James S.C. Chang, K. Nauka

Journal:

Journal of Crystal Growth

Year:

1989

Language:

english

File:

PDF, 692 KB

english, 1989

16

ChemInform Abstract: Isolation, Structure Elucidation, and Synthesis of Irlbacholine, 1,22- Bis(((2-(trimethylammonium)ethoxy)phosphinyl)oxy)docosane: A Novel Antifungal Plant Metabolite from Irlbachia alata and Anthocleista djalonensis.

D. E. BIERER, R. E. GERBER, S. D. JOLAD, R. P. UBILLAS, J. RANDLE, E. NAUKA, J. LATOUR, J. M. DENER, D. M. FORT, J. E. KUO, W. D. INMAN, L. G. DUBENKO, F. AYALA, A. OZIOKO, C. OBIALOR, E. ELISABETSKY,

Journal:

Year:

1996

File:

PDF, 32 KB

1996

17

Electrical characteristics of diodes fabricated in selective Si/Si1−xGexepitaxial layers

T. I. Kamins, K. Nauka, R. D. Jacowitz, J. L. Hoyt, D. B. Noble, J. F. Gibbons

Journal:

Journal of Electronic Materials

Year:

1992

Language:

english

File:

PDF, 1.08 MB

english, 1992

18

Characterization of p-N Si1-xGex/Si heterojunctions grown by limited reaction processing

King, C.A., Hoyt, J.L., Gronet, C.M., Gibbons, J.F., Scott, M.P., Rosner, S.J., Reid, G., Laderman, S., Nauka, K., Kamins, T.I.

Journal:

IEEE Transactions on Electron Devices

Year:

1988

Language:

english

File:

PDF, 161 KB

english, 1988

19

Deposited charge measurements on silicon wafers after plasma treatment

Shohet, J.L., Nauka, K., Rissman, P.

Journal:

IEEE Transactions on Plasma Science

Year:

1996

Language:

english

File:

PDF, 231 KB

english, 1996

20

A novel deposition method for thin-film electroluminescent devices

R. Hiskes, S. A. DiCarolis, R. Mueller-Mach, V. Mazzi, K. Nauka, G. O. Mueller

Journal:

Journal of the Society for Information Display

Year:

1997

File:

PDF, 519 KB

1997

21

[IEEE 2012 20th Telecommunications Forum Telfor (TELFOR) - Belgrade, Serbia (2012.11.20-2012.11.22)] 2012 20th Telecommunications Forum (TELFOR) - Paper title: Sequence generator for computing arbitrary n-input Boolean function using two memristors

Teodorovic, Predrag, Vukobratovic, Bogdan, Struharik, Rastislav, Dautovic, Stanisa, Nauka, Fakultet tehnickih, Sad, Novi

Year:

2012

File:

PDF, 223 KB

2012

22

Assessment of granulation technologies for an API with poor physical properties

Dalziel, Gena, Nauka, Ewa, Zhang, Feng, Kothari, Sanjeev, Xie, Minli

Journal:

Drug Development and Industrial Pharmacy

Year:

2013

Language:

english

File:

PDF, 1.09 MB

english, 2013

23

Effect of nitrogen on the electronic band structure of group III-N-V alloys

Shan, W., Walukiewicz, W., Yu, K. M., Ager, J. W., Haller, E. E., Geisz, J. F., Friedman, D. J., Olson, J. M., Kurtz, Sarah R., Nauka, C.

Journal:

Physical Review B

Year:

2000

Language:

english

File:

PDF, 66 KB

english, 2000

24

Small-geometry, high-performance, Si-Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistors

T. Kamins, K. Nauka, J. Kruger, J. Hoyt, C. King, D. Noble, C. Gronet, J. Gibbons

Journal:

IEEE Electron Device Letters

Year:

1989

Language:

english

File:

PDF, 323 KB

english, 1989

25

[IEEE 2014 16th International Conference on Transparent Optical Networks (ICTON) - Graz, Austria (2014.7.6-2014.7.10)] 2014 16th International Conference on Transparent Optical Networks (ICTON) - Cooperative cyclic sleep and doze mode selection for NG-PONs

Fernando, D. Nauka V., Milosavljevic, Milos, Kourtessis, Pandelis, Senior, John M.

Year:

2014

Language:

english

File:

PDF, 441 KB

english, 2014

26

[IEEE IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science - San Diego, CA, USA (19-22 May 1997)] IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science - Experimental study of charging processes on unpatterned oxide-coated Si wafers in an ECR etcher

Cismaru, C., Shohet, J.L., Hershkowitz, N., Nauka, K., Friedmann, J.B.

Year:

1997

Language:

english

File:

PDF, 191 KB

english, 1997

27

[IEEE 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Santa Barbara, CA, USA (27-31 March 1994)] Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Wafer bonding of InP and GaAs: interface characterization and device applications

Yang, L., Carey, K., Ludowise, M., Perez, W., Mars, D.E., Fouquet, J.E., Nauka, K., Rosner, S.J., Ram, R.J., Dudley, J.J., Babic, D.I., Bowers, J.

Year:

1994

Language:

english

File:

PDF, 194 KB

english, 1994

28

[IEEE 1996 IEEE International SOI Conference Proceedings - Sanibel Island, FL, USA (30 Sept.-3 Oct. 1996)] 1996 IEEE International SOI Conference Proceedings - Impact of supplemental Si implantation into SIMOX buried oxide

Krska, J.-H.Y., Yoon, J.U., Kim, G.N., Joyner, K., Nauka, K., Chung, J.E.

Year:

1996

Language:

english

File:

PDF, 284 KB

english, 1996

29

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - Si/Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistors fabricated by limited reaction processing

Gibbons, J.F., King, C.A., Hoyt, J.L., Noble, D.B., Gronet, C.M., Scott, M.P., Rosner, S.J., Reid, G., Laderman, S., Nauka, K., Turner, J.

Year:

1988

File:

PDF, 285 KB

1988

30

[IEEE 1995 IEEE International SOI Conference - Tucson, AZ, USA (3-5 Oct. 1995)] 1995 IEEE International SOI Conference Proceedings - Surface photovoltage monitoring of the Si-buried oxide interface charges

Nauka, K., Cao, M., Assaderaghi, F.

Year:

1995

Language:

english

File:

PDF, 284 KB

english, 1995

31

Nitrogen-related deep electron traps in float zone silicon

Nauka, K., Goorsky, M. S., Gatos, H. C., Lagowski, J.

Journal:

Applied Physics Letters

Year:

1985

Language:

english

File:

PDF, 478 KB

english, 1985

32

Intrinsic gettering in oxygen-free silicon

Nauka, N., Lagowski, J., Gatos, H. C., Li, C.-J.

Journal:

Applied Physics Letters

Year:

1985

Language:

english

File:

PDF, 527 KB

english, 1985

33

Silicon nitride films grown on silicon below 300 °C in low power nitrogen plasma

Paloura, E., Nauka, K., Lagowski, J., Gatos, H. C.

Journal:

Applied Physics Letters

Year:

1986

Language:

english

File:

PDF, 484 KB

english, 1986

34

Interactions between organic photoconductor and plasma discharge within an electrophotographic environment

Nauka, K., Chang, Seongsik, Ng, Hou T.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2009

Language:

english

File:

PDF, 769 KB

english, 2009

35

Admittance spectroscopy measurements of band offsets in Si/Si1−xGex/Si heterostructures

Nauka, K., Kamins, T. I., Turner, J. E., King, C. A., Hoyt, J. L., Gibbons, J. F.

Journal:

Applied Physics Letters

Year:

1992

Language:

english

File:

PDF, 583 KB

english, 1992

36

Electron beam induced current and cathodoluminescence imaging of the antiphase domain boundaries in GaAs grown on Si

K. Nauka, G. A. Reid, Z. Liliental-weber

Year:

1990

Language:

english

File:

PDF, 671 KB

english, 1990

37

Structural and optical properties of pseudomorphic In[sub x]Ga[sub 1−x]N alloys

Romano, L. T., Krusor, B. S., McCluskey, M. D., Bour, D. P., Nauka, K.

Journal:

Applied Physics Letters

Year:

1998

Language:

english

File:

PDF, 365 KB

english, 1998

38

New intrinsic gettering process in silicon based on interactions of silicon interstitials

Nauka, K., Lagowski, J., Gatos, H. C., Ueda, O.

Journal:

Journal of Applied Physics

Year:

1986

Language:

english

File:

PDF, 846 KB

english, 1986

39

Crystal structure of κ-In[sub 2]Se[sub 3]

J. Jasinski, W. Swider, J. Washburn, Z. Liliental-weber, A. Chaiken, K. Nauka, G. A. Gibson, C. C. Yang

Year:

2002

Language:

english

File:

PDF, 523 KB

english, 2002

40

Electron-Beam Detection of Bits Reversibly Recorded on Epitaxial InSe/GaSe/Si Phase-Change Diodes

Chaiken, Alison, Gibson, Gary A., Chen, John, Yeh, Bao S., Jasinski, J. B., Liliental-Weber, Z., Nauka, K., Yang, C. C., Lindig, D. D., Subramanian, S.

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 369 KB

english, 2006

41

Identification of intrinsic gettering centers in oxygen-free silicon crystals

Ueda, O., Nauka, K., Lagowski, J., Gatos, H. C.

Journal:

Journal of Applied Physics

Year:

1986

Language:

english

File:

PDF, 701 KB

english, 1986

42

[IEEE 1st International Symposium on Plasma Process-Induced Damage - Santa Clara, CA (13-14 May 1996)] Proceedings of 1st International Symposium on Plasma Process-Induced Damage - Surface Photovoltage and Contact Potential Difference Imaging of Defects Introduced by Plasma Processing of IC Devices

Nauka, K., Theil, J., Chi, C., Greene, W.M., Shohet, J.L.

Year:

1996

Language:

english

File:

PDF, 702 KB

english, 1996

43

Erratum: ‘‘New intrinsic gettering process in silicon based on interactions of silicon interstitials’’ [J. Appl. Phys. 60, 615 (1986)]

Nauka, K., Lagowski, J., Gatos, H. C., Ueda, O.

Journal:

Journal of Applied Physics

Year:

1987

Language:

english

File:

PDF, 276 KB

english, 1987

44

Oxygen-induced recombination centers in as-grown Czochralski silicon crystals

Journal:

Applied Physics Letters

Year:

1983

Language:

english

File:

PDF, 395 KB

english, 1983

45

Relationship between the charging damage of test structures and the deposited charge on unpatterned wafers exposed to an electron cyclotron resonance plasma

Cismaru, C., Shohet, J. L., Nauka, K., Friedmann, J. B.

Journal:

Applied Physics Letters

Year:

1998

Language:

english

File:

PDF, 333 KB

english, 1998

46

Phase-change recording medium that enables ultrahigh-density electron-beam data storage

Gibson, G. A., Chaiken, A., Nauka, K., Yang, C. C., Davidson, R., Holden, A., Bicknell, R., Yeh, B. S, Chen, J., Liao, H., Subramanian, S., Schut, D., Jasinski, J., Liliental-Weber, Z.

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 333 KB

english, 2005

47

Multilayer structured polymer light emitting diodes with cross-linked polymer matrices

Zhou, Zhang-Lin, Sheng, Xia, Nauka, K., Zhao, Lihua, Gibson, Gary, Lam, Sity, Yang, Chung Ching, Brug, James, Elder, Rich

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 345 KB

english, 2010

48

Analysis of wafer fusing for 1.3 μm vertical cavity surface emitting lasers

Ram, R. J., Yang, L., Nauka, K., Houng, Y. M., Ludowise, M., Mars, D. E., Dudley, J. J., Wang, S. Y.

Journal:

Applied Physics Letters

Year:

1993

Language:

english

File:

PDF, 594 KB

english, 1993

49

Electrical and structural properties of diodes fabricated in thick, selectively deposited Si/Si/sub 1-x/Ge/sub x/ epitaxial layers

Kamins, T.I., Nauka, K., Jacowitz, R.D., Hoyt, I.L., Noble, D.B., Gibbons, J.F.

Journal:

IEEE Electron Device Letters

Year:

1992

Language:

english

File:

PDF, 315 KB

english, 1992

50

Structural and electronic properties of amorphous and polycrystalline In[sub 2]Se[sub 3] films

Chaiken, A., Nauka, K., Gibson, G. A., Lee, Heon, Yang, C. C., Wu, J., Ager, J. W., Yu, K. M., Walukiewicz, W.

Journal:

Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 481 KB

english, 2003

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